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GOEPEL Electronics
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- JTAG/Boundary Scan platform SCANFLEX® incorporates new PXI controllers for critical applications
- New Boundary Scan I/O Modules enable structural Test of PCI Express Slots via IEEE Std. 1149.6
- Brandnew modular High-End AOI System from GOEPEL electronic
- JTAG/Boundary Scan Module extends structural Test Coverage to SO-DIMM200 Interfaces
- GOEPEL electronic offers End-of-Line Test System
- GOEPEL introduces IEEE-Std. 1149.6 compliant JTAG/Boundary Scan I/O module
GOEPEL Electronics
Jena, Germany; Las Vegas, NV – At the APEX tradeshow, GÖPEL electronic, a worldwide leading vendor of JTAG/Boundary Scan solutions compliant to IEEE1149.x, introduces a brand-new I/O module called CION Module™/FXT114S. |
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