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Home News Test Industry related news
Test Industry related news

LXI Consortium Hosted the First Public LXI Day at 12th PlugFest

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The LXI Consortium recently hosted its12th PlugFest and the first ever LXI Day in Toronto. While the PlugFest on May 21-22 was an LXI Consortium members-only event, LXI Day, hosted by Testforce Systems on May 23, was for the general test and measurement community. This complimentary special event showcased technical application presentations that explained benefits offered by LXI, its importance to the future of test and measurement, and how it can be implemented in a diverse array of applications. Working demonstrations of LXI products also were held.
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Cambridge; London, UK – Goepel electronic, global leader for IEEE 1149.x JTAG / Boundary Scan solutions introduced at National Electronics Week (NEW) a new series of PXI-Bus based controllers for its revolutionary Boundary Scan hardware platform SCANFLEX® - SFX/PXI1149/C4-FXT, the new family of SCANFLEX® Boundary Scan Controllers (SFX controller) comprising of three different performance class versions.
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