DFT Guide

... because Design For Testability is important

 
  • Increase font size
  • Default font size
  • Decrease font size
IEEE Standards related to DFT

SJTAG

E-mail Print PDF

At the IEEE European Board Test Workshop held in Tallinn, Estonia, May 2005, a group of 14 board test professionals met to discuss a common set of problems associated with the extended test and configuration use of 1149.1 boundary-scan infrastructure within complex multi-board systems. As a result of this discussion, it was decided to create a system-level JTAG initiative, called System JTAG (SJTAG). 

SJTAG Mission

The goal for SJTAG is: For all variants of XBST and EBST, to define the data contents and formats communicated between external Test Manager platforms and internal Embedded Test Controllers, and between ETCs and the UUTs they serve in an open-standard, vendor-independent and non-proprietary way.
[from the STAG website
 

GOEPEL electronic’s TESSY extended is a fully automated electronic functional test system for the production of electronic devices in vehicles. TESSY extended supports EOL tester lines (EOL = End of Line) with cross-linked test cells, from Ident-Scan of the 2-D code via multiple parallel test to laser marking and sorting of faulty parts – for quantities of more than one million devices.  
Read more...