The Mobile Industry Processor Interface (MIPI) Test and Debug Working group has selected a new test and debug interface, called Compact JTAG (cJTAG), which builds upon the IEEE1149.1 standard. IEEE standard 1149.7, approved in late 2009, enables advancements in test and debug functionality while maintaining compatibility with IEEE 1149.1 by creating a superset of the IEEE 1149.1 test interface.
A primary objective of cJTAG was to preserve the industry’s hardware and software investments in this standard. With cJTAG, existing tools or Debug and Test Systems (DTS), such as an IEEE 1149.1 emulator, and Target System (TS) chips, can simply be extended with adapters to convert to the cJTAG interface.
