DFT Guide

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IEEE Standards related to DFT

BSDL

Thursday, 07 August 2008 20:17
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The Boundary Scan Description Language (BSDL), as defined in IEEE 1149.1, Annex B, is used to document the Boundary Scan resources available in a particular IC and to present that information to software tools in a machine readable form for automated processing.  Practically all Boundary Scan tools read and analyze BSDL files in order to undertand which test modes are supported by the device and which Boundary Scan cell must be used to toggle a particular pin, for example. More sophisticated tools use BSDL files in conjunction with CAD data (e.g. the netlist of the Unit Under Test) for automated test generation.
 

Cambridge; London, UK – Goepel electronic, global leader for IEEE 1149.x JTAG / Boundary Scan solutions introduced at National Electronics Week (NEW) a new series of PXI-Bus based controllers for its revolutionary Boundary Scan hardware platform SCANFLEX® - SFX/PXI1149/C4-FXT, the new family of SCANFLEX® Boundary Scan Controllers (SFX controller) comprising of three different performance class versions.
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