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DFT Guidelines for JTAG/Boundary Scan

This website presents various Design For Testability guideline for JTAG/Boundary Scan. This test technology, standardized as IEEE 1149.1 - and expanded with new standards such as IEEE 1149.4 and IEEE 1149.6 - provides a powerful means to access device, board, and system level circuitry, enabling applications such as connectivity tests, on-board and in-system configuration and programming, and even simple functional tests and/or debugging and emulation.

Chip level DFT Guidelines ( 5 Articles )
Board level DFT Guidelines ( 11 Articles )
System level DFT Guidelines ( 1 Articles )
DFT References ( 2 Articles )

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GOEPEL Electronics

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At the SMT/Hybrid/Packaging trade show GOEPEL electronic, a world-class vendor of JTAG/Boundary Scan solutions compliant with the IEEE Std.1149.x, officially announces the introduction of the CION Module™/SO-DIMM200 to the market as another I/O module of the CION product family.